miércoles, 7 de febrero de 2018

Atom Probe Tomography and Microscopy 2018 | NIST

Atom Probe Tomography and Microscopy 2018 | NIST



Join us for the premier international gathering of 200+ interdisciplinary researchers in the fields of high field nanoscience and atom probe microscopy. The meeting will be held on June 10-15, 2018 at NIST, Gaithersburg, Md. Topics may include correlative and combined methods; reconstruction methods and data treatment; simulations, modeling and computational methods; quantification; field ion microscopy; laser-matter interactions; characterization of a wide variety of nanoscale materials and structures; specimen preparation and in-situ treatment; and instrument and technique development. 
This 6-day meeting will provide plenty of opportunities for informal discussion of new techniques and applications and chances to network with fellow researchers.
Join our Twitter Chat: #APTM2018 

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