Join us for the premier international gathering of 200+ interdisciplinary researchers in the fields of high field nanoscience and atom probe microscopy. The meeting will be held on June 10-15, 2018 at NIST, Gaithersburg, Md. Topics may include correlative and combined methods; reconstruction methods and data treatment; simulations, modeling and computational methods; quantification; field ion microscopy; laser-matter interactions; characterization of a wide variety of nanoscale materials and structures; specimen preparation and in-situ treatment; and instrument and technique development.
This 6-day meeting will provide plenty of opportunities for informal discussion of new techniques and applications and chances to network with fellow researchers.
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